32-ID-B of the Advanced Photon Source has pioneered the use of X-ray white beam from an undulator source to do ultrafast inline phase-contast imaging with an exposure time down to 100 ps and a repetition rate up to 6.5 MHz. We recently added the capability to do simultaneous diffraction. A newly installed specialized undulator (short period, single line @ 24 keV) allows us to add Small Angle Scattering to the mix of simultaneous techniques, all at an exquisite time resolution. In this talk, I will give an overview of the diverse programs running at the beamline, such as fluid dynamics, materials science, shock physics, and metal additive manufacturing.
|Title||Ultrafast X-ray imaging and complementary techniques at 32-ID beamline of the APS|
Imaging Group, Advanced Photon Source, Argonne National Laboratory, USA.
|Session||4. X-rays I|
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